Keynote :
The Influence of ISO26262 Standard (Revision) on Semiconductor Industry
  • Joongsik Kih, Doctor

  • QRT Inc.

  • Detail
Session 1 :
European Assesment Facility and Research Trend
  • Hoon-Kyu Shin, Professor


  • Detail
Session 2 :
FINFET Circuit Design with Resistance to SET(Single Event Transportation) For TID(Total Ionizing Dose)
Analysis and Physical Modeling of Ionized Current
  • Ji-Woon Yang, Professor

  • Korea University

  • Detail
Session 3 :
Calculation for Soft Error Frequency of Occurence and Static Testing
  • Woo Joon Lee, Research Engineer

  • Korea Aerospace Research Institute

  • Detail
Session 4 :
Evaluation Report and Data Analysis for Soft Error
  • Sung Chung, CTO

  • QRT Inc. Republic of Korea

  • Detail

*Programs and topics(speakers) are displayed based on the recent conference, 2019 ASSIC Korea.