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Keynote :
SEU – The Natural Radiation Environment as a Hazard to Ground-Level Autonomous Systems
  • Jonathan Pellish, PhD.

  • NASA Electronic Parts Manager
    NASA Goddard Space Flight Center

  • Detail
Session 1 :
IoT – Reliability and Functional Safety for Smart Automotive Systems
  • Riccardo Mariani, PhD.

  • Intel Fellow
    Chief Functional Safety Technologist at Intel Corporation,
    2019 IEEE CS VP for Standards

  • Detail
Session 2 :
EDA – Test for the Autonomous Age for next Generation Functional Safety
  • Janusz Rajski PhD.

  • Vice President of Engineering,
    DFT expert, inventor and scientist.
    Mentor Graphics, a Siemens Business

  • Detail
Session 3 :
SSD – Flash-based Solid-State Disks Technology in Autonomous Driving
  • Yu Cai, PhD.

  • Software Engineer at Facebook
    San Jose, California

  • Detail
Session 4 :
DRAM&Memory – TBD
  • Raymond. Park

  • Technical Marketing Manager
    SK Hynix

  • Detail
Session 5 :
Packaging - Automotive Qualification Requirements for Semiconductors Including ISO26262-11
  • Klaus J.Pietrczak

  • Founder and owner of KPM Consulting Service LLC
    San Francisco Bay Area

  • Detail
Session 6 :
ISO 26262 – Why ISO 26262 Functional safety Demands New Innovation
  • Sung Chung, CTO

  • QRT Inc. Republic of Korea

  • Detail
Tutorial Session :
Single Event Effect Tutorial
  • Raoul Velazco, PhD.

  • Université Grenoble Alpes Laboratoire TIMA Grenoble

  • Detail
Tutorial Session :
Materials Analysis Technologies for Advanced FA
  • Sang Min Lee, PhD.

  • General Manager at Outermost Technology

  • San Jose CA USA

  • Detail
Tutorial Session :
Overview of Automotive Reliability Test
  • Young Noh. Kim

  • Technical marketing Team Leader

  • QRT Inc. Republic of Korea

  • Detail