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Keynote :
Automotive Test and Reliability
  • Yervant Zorian

  • Chief Architect and Synopsys Fellow, Synopsys

  • Detail
Session 1 :
Transient failure analysis & mitigation techniques for ISO 26262
  • Dan lexandrescu

  • Chief Executive Officer, IROC Technologies

  • Detail
Session 2 :
Automotive device packaging technology
  • Goo Lee

  • Product & Technology Marketing, STATS ChipPAC

  • Detail
Session 3 :
Automotive IC test challenges and emerging test methods
  • Stephen Pateras

  • Ph.D. Product Marketing Director

  • Tessent BIST and Automotive Solutions

  • Mentor, a Siemens company

  • Detail
Session 4 :
C-ITS development status and automated driving policy in Korea
  • Kyeong-Pyo Kang

  • Ph.D. Researcher Fellow at the Korea Transport Institute (KOTI)

  • Detail
Session 5 :
Storage technology for connected and autonomous vehicle
  • Kevin Tran

  • Automotive Technical Marketing Director, SK Hynix

  • Detail
Session 6 :
Automotive Safety Challenges based on ISO 26262 requirement
  • Sung S. Chung

  • CTO and Head of R&D, QRT Inc.

  • Detail