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Program Schedule
Session Time Technical Session Parallel Tutorial
Session
08:40~09:10 Registration
09:10~09:15 Welcome Address and Opening the Conference
09:15~10:10
(Q&A 5 min)
Key Note: SEU – Jonathan Pellish
10:10~11:05
(Q&A 5 min)
Session 1 : IoT
– Riccardo Mariani
SEE Tutorial 1
– Raoul Velazco
11:05~11:15 Break
11:15~12:10
(Q&A 5 min)
Session 2 : EDA
– Janusz Rajski
SEE Tutorial 2
– Raoul Velazco
12:10~13:10 Lunch
13:10~14:05
(Q&A 5 min)
Session 3 : SSD
– Yu Cai
Advanced FA Tutorial 1
– Sang M. Lee
14:05~15:00
(Q&A 5 min)
Session 4 : DRAM
– Raymond Park
Advanced FA Tutorial 2
– Sang M. Lee
15:00~15:10 Break
15:10~16:05
(Q&A 5 min)
Session 5 : Packaging
– Klaus Pietrczak
Advanced Reliability Test Tutorial 1
– Young Noh. Kim
16:05~17:00
(Q&A 5 min)
Session 6 : ISO 26262
– Sung Chung
Advanced Reliability Test Tutorial 2
–Young Noh. Kim
17:00~17:20 Raffle and Announcement
17:20~17:30 Closing Remark and Adjournment
Networking Time from 17:30 to 18:00
Technical Session Theme Outline
No. About Tutorial Session Title Speaker
Name Company
1 SEU The Natural Radiation Environment as a Hazard to Ground-Level
Autonomous Systems
Presentation Abstract Jonathan
Pellish
NASA
2 IoT Reliability and Functional Safety for Smart Automotive Systems Presentation Abstract Riccardo
Mariani
IOTG Intel
3 EDA Test for the Autonomous Age for next Generation Functional Safety Presentation Abstract Janusz
Rajski
Mentor
Graphics
4 Flash SSD Flash-based Solid-State Disks Technology in Autonomous Driving Presentation Abstract Yu Cai Facebook
5 DRAM DRAM & Memory Technology for Automotive Application Presentation Abstract Raymond
Park
SK Hynix
6 Packaging Automotive Qualification Requirements for Semiconductors
Including ISO26262-11
Presentation Abstract Klaus
J.Pietrczak
KPM
Consulting
Service
7 ISO 26262 Why ISO 26262 Functional Safety Demands New Innovation Presentation Abstract Sung
Chung
QRT Inc.
Tutorial Session Theme Outline
No. About Tutorial Session Title Speaker
Name Company
1 SEE Single Event Effect Tutorial Presentation Abstract Raoul
Velazco
TIMA
2 FA Materials Analysis Technologies for Advanced FA Presentation Abstract Sang M.
Lee
Outermost
QRT inc.
3 Reliability Overview of Automotive Reliability Test Presentation Abstract Young
Noh. Kim
QRT Inc.