
Jonathan Pellish, PhD.
NASA Electronic Parts Manager
NASA Goddard Space Flight Center
Automotive Test and Reliability
Dr. Jonathan “Jonny” Pellish is employed at the Goddard Space Flight Center (GSFC) as the National Aeronautics and Space Administration’s Electrical, Electronic, and Electromechanical (EEE) Parts Manager, responsible for workforce stewardship and coordinating Agency-wide discipline technical activities in the EEE parts and radiation effects engineering communities. Currently, Jonny is also the acting program manager for the NASA Electronic Parts and Packaging (NEPP) Program, which is operated by GSFC for the NASA Office of Safety and Mission Assurance. Dr. Pellish received the B.S. degree in physics from Vanderbilt University in 2004, and the M.S. and Ph.D. degrees in electrical engineering from Vanderbilt University in 2006 and 2008. Jonny has authored or co-authored over 60 refereed publications in addition to numerous conference and workshop presentations. He is a member of the American Institute of Aeronautics and Astronautics and the Institute for Electrical and Electronics Engineers.

Kyeong-Pyo Kang, Ph.D.
Researcher Fellow at the Korea
Transport Institute (KOTI)
The Impact of C-ITS and Soft Error
Dr. Kyeong-Pyo Kang received the M.S. degree in transportation management at urban planning area from Seoul National University, South Korea in 1998, and then the Ph.D. degree in transportation engineering at the University of Maryland at College Park (UMCP), U.S.A. in 2006. His research is focused mainly on the advanced highway operations based on the intelligent transportation systems (ITS).
He is currently working in the Korea Transport Institute (KOTI) as a research fellow since graduated UMCP. He conducted key research and development (R&D) projects related next-generation ITS technologies for improving safety, sustainability as well as efficiency. One of them is development of the core technologies for u-Transportation systems, which is enabling to communicate between vehicle and vehicle (V2V) and vehicle and infrastructure (V2I) and being recognized as the Cooperative, it's (C-ITS) in the world.
He is now involved in C-ITS pilot deployment project while supporting the ITS division in Ministry of Land, Infrastructure, and Transport (MOLIT). He is establishing the ITS Master Plan, and international cooperation with U.S. DOT (Department of Transportation), and EC DG (Directorate-General) RTD/MOVE/CONNECT in the field of ITS.

Raoul Velazco, PhD.
Université Grenoble Alpes Laboratoire TIMA Grenoble
Single Event Effect Basis
Dr. Raoul VELAZCO was born in Montevideo (Uruguay) in 1952. Living in France since 1976, he got there the PhD and the Doctor ès Sciences in Computer Sciences in 1982 and 1990 respectively, both from INPG (Institut National Polytechnique de Grenoble). Since 1984 he is a researcher at CNRS (French Research Agency), being presently Director of Researches. Since 1996 he works at TIMA Labs. (Grenoble) where he leads RIS (Reliable Integrated circuits and Systems) research group. His researches concern the methodology to assess the sensitivity to the effects of radiation of integrated circuits and systems, the potential solutions to deal with these effects, the related tests in particle accelerator facilities and experiments at high altitude (mountains, planes, scientific satellites). Dr. Velazco was general chair of two important events related with these topics: IEEE RADECS (RADiation and its Effects in Circuits and Systems) in 2001 and Single Event Effects Symposium in 2009. He was the Technical Chair of RADECS 2012 held September 2012 in Biarritz (France). He is also the creator and general co-chair of the international school SERESSA (School on the Effects of Radiation on Embedded Circuits for Space Applications), whose 2018 edition was held in Noordwijk (The Netherlands) organized in cooperation with European Space Agency (ESA/ESTEC).

Sanghyeon Baek, Professor
Hanyang University
Tests for Korean SEU R&D and DRAM Soft Errors
Professor of Electrical and Communication Engineering
E-mail : bau@hanyang.ac.kr
Phone : 031 400 5237
Office : 321, 4th Engineering Building Education B.Sc. 1986, Hanyang University, Electronic Engineering
M.S. 1988, The University of Texas at Austin, Electrical and Computer Engineering
Ph.D. 1994, The University of Texas at Austin, Electrical and Computer Engineering Work Experience
Jun. 2017-Jun. 2018, Visiting Professor, Cisco Systems Inc., San Jose, CA, USA
Jan. 2010-Present, Professor, Hanyang University, Ansan, Korea
Jan. 2004-Jan. 2010, Associate Professor, Hanyang University, Ansan, Korea
Jan. 1997-Jan. 2004, Hardware Manager, Technical Leader, Cisco Systems Inc.,
San Jose, CA, USA (2001-2004 한국지부 ASIC 기술개발연구소 소장 겸임)
Sep. 1994-Feb. 1997, Sr. Design Engineer, Samsung Semiconductor Inc.,
Giheung, Korea and San Jose, USA Professional Activities
Jan. 2014-Present, Organizing member of the Institute of Semiconductor Test of Korea
Jan. 2012-Dec. 2013, President of the Institute of Semiconductor Test of Korea
Jan. 2010-Dec. 2011, Chief Editor of the Institute of Semiconductor Test of Korea
Apr. 2003, Working Group Member, IEEE Standard 1149.6

Sung Chung, CTO
CTO of QRT Inc.
Current States of Soft Error and Future Direction for R&D
Sung Chung been CTO at QRT Inc. Korea since May 2017 with responsibility of leading R&D team; developing new market segment through technical marketing and creating new solutions for ISO 26262 Automotive Functional Safety Standard. Mr. Sung joined the company after spending 35+ yeare in silicon Valley.
Before joining QRT Inc. Korea, Chung served varioius positions at cisco System where he spent 14+ years. During his stay at Cisco Systems. Chung developed companyeide SEU mitigation process. had responsibiltiy of he developed AC JTAG, and it became a IEEE Std. 1149.6~2003 - IEEE Standard for Bundary-Scan Testing of aDvanced Digital Networks. Chung also participated various IEEE Test and JEDEC SEU Standard activities as a working group member.
Mr. Chung received a Master of Science Degrre in EE from Florda Institur of Technology. Mellbourne FL. USA. He Published over 40+ technical papers/pressntations on DFT, Boundary-Scan, BIST, and SEU. He holds 20US and Korean Patent in the field of test and DFT. Sung is a Life Member of IEEE. Currently. he Lives in Korea and speaks fluent English and Korean
- Keynote :
Highly Reliable Semiconductor and Soft Error Jonathan Pellish, PhD.
NASA Electronic Parts Manager
NASA Goddard Space Flight Center- Detail
- Session 1 :
The Impact of C-ITS and Soft Error -
Kyeong-Pyo Kang, Ph.D.
Researcher Fellow at the Korea Transport Institute (KOTI)
- Detail
- Session 2 :
Korean Acceleratin Neutron Assessment Facility Status and Trend -
Moohyun Cho
NINT(National Institute For Nanomaterials Technology)
- Detail
- Session 3 :
Single Event Effect Basis -
Raoul Velazco, PhD.
Université Grenoble Alpes Laboratoire TIMA Grenoble
- Detail
- Session 4 :
Tests for Korean SEU R&D and DRAM Soft Errors -
Sanghyeon Baek, Professor
Hanyang University
- Detail
- Session 5 :
Current States of Soft Error and Future Direction for R&D -
Sung Chung, CTO
CTO of QRT Inc.
- Detail