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Keynote :
Highly Reliable Semiconductor and Soft Error
  • Jonathan Pellish, PhD.

  • NASA Electronic Parts Manager
    NASA Goddard Space Flight Center

  • Detail
Session 1 :
The Impact of C-ITS and Soft Error
  • Kyeong-Pyo Kang, Ph.D.

  • Researcher Fellow at the Korea Transport Institute (KOTI)

  • Detail
Session 2 :
Korean Acceleratin Neutron Assessment Facility Status and Trend
  • Moohyun Cho

  • NINT(National Institute For Nanomaterials Technology)

  • Detail
Session 3 :
Single Event Effect Basis
  • Raoul Velazco, PhD.

  • Université Grenoble Alpes Laboratoire TIMA Grenoble

  • Detail
Session 4 :
Tests for Korean SEU R&D and DRAM Soft Errors
  • Sanghyeon Baek, Professor

  • Hanyang University

  • Detail
Session 5 :
Current States of Soft Error and Future Direction for R&D
  • Sung Chung, CTO

  • CTO of QRT Inc.

  • Detail