Program Schedule
No. Time Session Title Speaker Presentation
1 10:00~10:10 Welcome &
Opening the Conference
Conference Chair
2 10:10~11:00 Highly Reliable Semiconductor & Soft Error Jonathan A. Pellish
Presentation Slide
3 11:00~11:50 The Impact of C-ITS & Soft Error Kyeong-Pyo Kang,
Specialist of KOTI*
*Korea Transport Institute
Presentation Slide
4 11:50~13:20 Lunch & Lab tour
5 13:20~13:50 Acceleratin Neutron Assessment Facility
Status & Trend in Korea
Moohyun Cho,
Executive President of NINT*
*National Institute for Nanmaterials Technology
Presentation Slide
6 13:50~14:40 Single Event Effect Basics Raoul Velazco
7 14:40~15:00 Break
8 15:00~15:50 Tests for Korean SEU R&D
& DRAM Soft Errors
Sanghyeon Baeg, Prof.
(Hanyang University)
Presentation Slide
9 15:50~16:40 Current States of Soft Error
& Future Direction for R&D
Sung Chung, CTO
(QRT Inc.)
Presentation Slide
10 16:40~17:00 Raffle and djournment