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Automotive Semiconductor Safety Innovation Conference ceo

As semiconductor mounting increases in self-driving cars, urban aviation mobility, and aerospace, which are important to passenger safety, strict management of the functional safety and reliability of automotive and electronic parts manufacturers is required.
As the complexity of electronics increases, the responsibility for handling functional safety should be extended to semiconductor manufacturers to meet the standard of semiconductor functional safety for vehicles. The semiconductor and systems industries should clarify the failure rate analysis for the safety integrity level of the product and include it in the design and evaluation requirements.

Now, at our fifth conference, we'd like to share research and practice with you under the theme of "Soft Error Technology Application Applications to Advanced Vehicles" to discuss new challenges, visions, and collaboration for activation.

Please understand the need and case of semiconductor soft error verification at the ASSIC 2021 conference and use it as an opportunity to achieve functional safety and reliability of automotive semiconductors.

CEO of QRT Inc. Kim, Young-Boo

Date : 17th June 2021 Welcome Message

Program Schedule

Session Time Session Title Speaker
10:30~10:40
(10min)
Welcome and Opening the Conference
10:40~11:20
(40min)
S1Device for Space and Automotive Device Degradation due to Radiation on Silicon Transistors Jungsik Kim, PhD
(Gyeongsang National University, Korea)
11:20~12:00
(40min)
The Importance of Reliability Evaluation and Radiation Test of Satellite Control System Hosang Yi
(APSI, Korea)
12:00~13:00
(60min)
Lunch
13:00~ 13:40
(40min)
S2Automotive Application : ,
Processor, Storage and Power Device
Functional Safety and Radiation Effects Considerations for AV Systems Jyotika Athavale, PhD
(nVidia, USA)
13:40~14:20
(40min)
Design Consideration for DRAM/SSD Automotive Functional Safety Application Keith Kim
(SK Hynix, USA)
14:20~15:00
(40min)
Power Semiconductor for Automotive Application : How safe is SOA(Safe Operation Area)? Joongsik Kih, PhD
(QRT, Korea)
15:00~15:20
(20min)
Break
15:20~16:00
(40min)
S3Device Radiation Test and Analysis Los Alamos In-House Expert’s Guideline for Successful Accelerated Neutron Test Steven Wender, PhD
(LANSCE, USA)
16:00~16:40
(40min)
Soft Error Test for Fast Moving Automotive Industry Sung Chung, CTO
(QRT, Korea)
16:40~16:50
(10min)
Adjournment

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