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Advanced Semiconductor Safety Innovation Conference

The Global Green Initiatives and Fourth Industrial Revolution, known as Knowledge Revolution, accelerate demands for more innovative and intelligent devices for future all-electric mobility and knowledge base applications.

As the complexity of electronics used in safety-critical applications increases, the commitment to support functional safety should be extended to semiconductor manufacturers to comply with the standards for all future electric vehicles. As a result, the soft error test has become more critical than ever before.

At this year's 6th ASSIC2022 Annual Conference, we like to bring hands-on practical information from renowned experts from each field under the theme "Advanced Radiation Testing, Data Analysis & Validation Examples." The Conference speakers are Nuclear Scientists from LANSCE and TRIUMF, and Femtosecond Laser-based SEE Scientists from the US and Great Britain.

We also introduce QRT's latest Soft Error Radiation Test innovations and share experts' opinions and implications on the newly revised JESD89B Soft Error Test Standards for future Soft Error Test Certification.

Please join us at ASSIC2022 and experience new hands-on Soft Error Knowledge with the experts. As we have celebrated during the last five conferences, the ASSIC2022 also brings a unique experience to you.

Chair of the Conference Chung, Sung Soo

Date : 17th June 2021 Welcome Message

Program Schedule

Time Topics Speaker
10:00~10:10
(10min)
Conference Opening Announcement
10:10~11:00
(50min)
Proton and Neutron Radiation Tests:
Making the Most of Your Beam Time
Camille Belanger-Champagne PhD.,
cbchampagne@triumf.ca
TRIUMF, Canada
11:00~11:50
(50min)
Fundamentals of the Pulsed-Laser Technique
for Single-Event Effects Testing
Dale McMorrow PhD.,
dale.mcmorrow@nrl.navy.mil
Naval Research Lab., USA
11:50~12:50
(60min)
Lunch Break
12:50~13:40
(50min)
Femto-second Laser System for General
Purpose Radiation Test And Analysis
Richard Sharp PhD.,
richard.sharp@radtest.co.uk
Radtest CEO, United Kingdom
13:40~14:30
(50min)
Advance Dram & SSD for Automotive Applications Keith Kim.,
jangryul.kim@us.skhynix.com
SK Hynix San Jose, USA
14:30~14:50
(20min)
Break Time
14:50~15:40
(50min)
New JEDEC JESD89B Standard and
Its Practical Impacts on Radiation Test
Joong Sik Kih PhD.,
jooongsik.kih@qrtkr.com
QRT Korea Inc., Korea
15:40~16:30
(50min)
Introduction to QRT's Advanced
Radiation Test & Data Analysis System
Sung Chung,
Sungsoo.chung@qrtkr.com
QRT Korea Inc., Korea
16:30~16:40
(10min)
Conference Closing & Adjournment

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World-Class Radiation effects capabilities.
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