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Keynote Speaker : SEU – The Natural Radiation Environment as a Hazard to Ground-Level Autonomous Systems

  • Jonathan Pellish, PhD.

    NASA Electronic Parts Manager

    NASA Electronic Parts and Packaging Program, Acting Manager

    Home Office: NASA Goddard Space Flight Center


Session 1 : IoT – Reliability and Functional Safety for Smart Automotive Systems

  • Riccardo Mariani, PhD.

    Intel Fellow
    Chief Functional Safety Technologist at Intel Corporation,
    2019 IEEE CS VP for Standards


Session 2 : EDA – Test for the Autonomous Age for next Generation Functional Safety

  • Janusz Rajski PhD.

    Vice President of Engineering,
    DFT expert, inventor and scientist.

    Mentor Graphics, a Siemens Business


Session 3 : SSD – Flash-based Solid-State Disks Technology in Autonomous Driving

  • Yu Cai, PhD.

    Software Engineer at Facebook
    San Jose, California


Session 4 : DRAM&Memory – TBD

  • Raymond. Park

    Technical Marketing Manager
    SK Hynix


Session 5 : Packaging - Automotive Qualification Requirements for Semiconductors Including ISO26262-11

  • Klaus J.Pietrczak

    Founder and owner of KPM Consulting Service LLC
    San Francisco Bay Area


Session 6 : ISO 26262 – Why ISO 26262 Functional safety Demands New Innovation

  • Sung Chung

    Sung S. Chung, CTO
    QRT Inc. Republic of Korea


Tutorial Session : Single Event Effect Tutorial

  • Raoul Velazco, PhD.

    Université Grenoble Alpes Laboratoire TIMA Grenoble


Tutorial Session : Materials Analysis Technologies for Advanced FA

  • Sang Min Lee, PhD.

    General Manager at Outermost Technology
    San Jose CA USA


Tutorial Session : Overview of Automotive Reliability Test

  • Young Noh. Kim

    Technical marketing Team Leader
    QRT Inc. Republic of Korea