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Program Schedule

Session Time Technical Session
Ice breaking from 08:00 ~
08:30~09:00 Registration
09:00~09:05 Welcome Address and Opening the Conference
09:05~10:00
(Q&A 5 min)
Key Note: Automotive E/E Part Application to Aerospace Industry: A New Perspective (NASA)
10:00~10:55
(Q&A 5 min)
Session 1 : Functional Safety for Complex Multi-Core Processor based Avionics Systems (Intel)
10:55~11:15 Break
11:15~12:10
(Q&A 5 min)
Session2 : Analysis of Total-Ionizing Dose (TID) and Physical Modeling of Ionization Current in FinFETs (TBD)
12:10~13:40 Lunch
13:40~14:35
(Q&A 5 min)
Session3 : Alpha Particle Induced Soft Error and Automotive Functional Safety (XIA LLC)
14:35~15:30
(Q&A 5 min)
Session 4 : Design Considerations for DRAM/SSD Automotive Functional Safety Application (SK Hynix)
15:30~15:50 Break
15:50~16:45
(Q&A 5 min)
Session5 : New International Standard Activities and Soft Error Data Analysis Examples for Functional Safety (QRT)
16:45~17:00
(Q&A 5 min)
Raffle & Announcement
17:00~17:10 Closing Remark & Adjustment
Networking Time from 17:10 ~

※ Sessions and speakers are subject to change.
※ TBD* : in the process of being approved.


Technical Session Theme Outline

No. About Technical Session Title
1 Aerospace E/E Automotive E/E Part Application to Aerospace Industry: A New Perspective Session Abstract
2 SEU Functional Safety for Complex Multi-Core Processor based Avionics Systems Session Abstract
3 Finfet Analysis of Total-Ionizing Dose (TID) and Physical Modeling of Ionization Current in FinFETs Session Abstract
4 Material Alpha Particle Induced Soft Error and Automotive Functional Safety Session Abstract
5 DRAM/SSD Design Considerations for DRAM/SSD Automotive Functional Safety Application Session Abstract
6 SEU New International Standard Activities and Soft Error Data Analysis Examples for Functional Safety Session Abstract

※ Sessions and speakers are subject to change.
※ TBD* : in the process of being approved.

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